WELCOME TO X-Ray-Soft
X-Ray-Soft develops software for simulation of diffraction and imaging properties of X-ray optics.RESEARCH AREAS OF X-Ray-Soft
- pioneering research and development in the area of novel methods of high-resolution X-ray imaging
- dynamical X-ray diffraction theory
- X-ray characterisation of semiconductor structures
"A Non-Iterative Reconstruction Method for Direct and Unambiguous Coherent Diffractive Imaging " by S.G. Podorov, K.M. Pavlov and D.M. Paganin, Optics Express (2007)
[ Read/Download PDF:English ]
Abstract:
We develop a deterministic algorithm for coherent diffractive imaging (CDI) that employs a modified Fourier transform of a Fraunhofer diffraction pattern to quantitatively reconstruct the complex scalar wavefield at the exit surface of a sample of interest. The sample is placed in a rectangular hole with dimensions at least two times larger than the sample. The non-iterative reconstruction algorithm is rapid, exact and gives a unique analytical solution to the inverse problem in the far-field diffraction case. The efficacy and stability of the algorithm, which may achieve resolutions in the nanoscale range, is demonstrated using simulated X-ray data.
"Mask-assisted deterministic phase–amplitude retrieval from a single far-field intensity diffraction pattern: Two experimental proofs of principle using visible light." by Sergey G. Podorov, Alexis I. Bishop, David M. Paganin and Konstantin M. Pavlov, Ultramicroscopy (2011)
[ Read/Download PDF:English ]
Abstract:
We recently developed a simple closed-form algorithm, which allows one to reconstruct the complex scalar wavefield at the exit surface of a sample, from the intensity of its far-field coherent diffraction pattern which is obtained in the presence of a suitable object-plane mask. In the first variant of this algorithm, the sample is contained within a uniformly illuminated sharp rectangular aperture in which at least one transverse dimension is at least twice that of the object. In the second variant, the sample is uniformly illuminated and is transversely displaced from an opaque rectangular mask in the object plane. For both variants, the far-field diffraction pattern is first Fourier transformed and then differentiated with respect to both transverse coordinates, in order to deterministically yield a series of independent reconstructions of the sample. Here we give an experimental demonstration of each of these two variants of our technique, using visible light.
SEVERAL CITATIONS AND APPLICATIONS:
Holography with extended reference by autocorrelation linear differential operation
Optics Express, Vol. 15, Iss. 26, pg. 17592 (2007).
Phase retrieval with Fourier-weighted projections
JOSA A, Vol. 25, Iss. 3, pg. 701 (2008).
Direct image reconstruction from a Fourier intensity pattern using HERALDO
Optics Letters, Vol. 33, Iss. 22, pg. 2668 (2008).
Phase retrieval with transverse translation diversity: a nonlinear optimization approach
Optics Express, Vol. 16, Iss. 10, pg. 7264 (2008).
Phase retrieval from a high-numerical-aperture intensity distribution by use of an aperture-array filter
JOSA A, Vol. 26, Iss. 10, pg. 2172 (2009).
Measurement of coherent x-ray focused beams by phase retrieval with transverse translation diversity
Optics Express, Vol. 17, Iss. 4, pg. 2670 (2009).
Direct reconstruction of an object from dual exposure Fourier intensity measurements
Applied Optics, Vol. 48, Iss. 15, pg. 2890 (2009).
Far-field diffraction analysis of submillimeter-thick bars for edge quality assessment
Journal of Micro/Nanolithography MEMS and MOEMS, Vol. 8, Iss. 3, pg. 031302 (2009).
Quantitative phase reconstruction from input-output intensities using a shift-invariant linear imaging system
Physical Review A, Vol. 79, Iss. 5, pg. 053803 (2009).
Holographic x-ray image reconstruction through the application of differential and integral operators
Optics Letters, Vol. 35, Iss. 7, pg. 928 (2010).
High-Resolution X-Ray Lensless Imaging by Differential Holographic Encoding
Physical Review Letters, Vol. 105, Iss. 4, pg. 043901 (2010).
Single-shot Femtosecond X-Ray Holography Using Extended References
Physical Review Letters, Vol. 105, Iss. 9, pg. 093901 (2010).
Femtosecond Snapshot Holography with Extended Reference
Using Extreme Ultraviolet Free-Electron Laser
Applied Physics Express Vol. 3 pg. 102701 (2010)
More publications are available for download at science and publications
email: ceo@x-ray-soft.de